Otros recursos de Rao, V.Ramgopal

Resultados 1 - 8 de 8 de Rao, V.Ramgopal. (0 segundos)


Documentos:
  1. Low Temperature Hot-Wire CVD Nitrides for Deep Sub-Micron CMOS Technologies (�)

    Patil, Samadhan B.; Vaidya, Sangeeta; Kumbhar, Alk; Dusane, R.O.; Chandorkar, A.N.; Ramgopal Rao, V.
    No abstract available.
    09-ene-2018

  2. Low Temperature Hot-Wire CVD Nitrides for Deep Sub-Micron CMOS Technologies (�)

    Patil, Samadhan B.; Vaidya, Sangeeta; Kumbhar, Alk; Dusane, R.O.; Chandorkar, A.N.; Ramgopal Rao, V.
    No abstract available.
    23-ene-2018

  3. Low temperature silicon nitride deposited by Cat-CVD for deep sub-micron metal–oxide–semiconductor devices (�)

    Patil, Samadhan B.; Kumbhar, Alka; Waghmare, Parag; Ramgopal Rao, V.; Dusane, R.O
    for deep-submicron CMOS technology. Electrical properties such as C–V and I–V measurements were
    09-ene-2018

  4. Low temperature silicon nitride deposited by Cat-CVD for deep sub-micron metal–oxide–semiconductor devices (�)

    Patil, Samadhan B.; Kumbhar, Alka; Waghmare, Parag; Ramgopal Rao, V.; Dusane, R.O
    for deep-submicron CMOS technology. Electrical properties such as C–V and I–V measurements were
    23-ene-2018

  5. Highly conducting doped poly-Si deposited by hot wire CVD and its applicability as gate material for CMOS devices (�)

    Patil, Samadhan B.; Vairagar, Anand V.; Kumbhar, Alka A.; Sahu, Laxmi K.; Ramgopal Rao, V.; Venkatramani, N.; Dusane, R.O.; Schroeder, B.
    material was monitored using C–V measurements on a MOS test device at different frequencies. The
    06-ene-2018

  6. Highly conducting doped poly-Si deposited by hot wire CVD and its applicability as gate material for CMOS devices (�)

    Patil, Samadhan B.; Vairagar, Anand V.; Kumbhar, Alka A.; Sahu, Laxmi K.; Ramgopal Rao, V.; Venkatramani, N.; Dusane, R.O.; Schroeder, B.
    material was monitored using C–V measurements on a MOS test device at different frequencies. The
    23-ene-2018

  7. A non-volatile resistive memory effect in 2,2′,6,6′-tetraphenyl-dipyranylidene thin films as observed in field-effect transistors and by conductive atomic force microscopy (�)

    Courté , Marc; Surya , Sandeep G.; Thamankar , Ramesh; Shen , Chao; Rao , V. Ramgopal; Mhailsalkar , Subodh G.; Fichou , Denis
    International audience
    22-mar-2018

  8. A Pilot Study on Feasibility and Effectiveness of Intraoperative Spectral-Domain Optical Coherence Tomography in Glaucoma Procedures (�)

    Kumar, Rajesh S.; Jariwala, Manan U.; V, Sathidevi A.; Venugopal, Jayasree P.; Puttaiah, Narendra K.; Balu, Ramgopal; Rao A. S, Dhanaraj; Shetty, Rohit
    24-mar-2015

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