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High mobility strained Si/SiGe heterostructure MOSFETs : channel engineering and virtual substrate optimization
Leitz, Christopher W. (Christopher William), 1976-
Location: http://hdl.handle.net/1721.1/8440
50658402

Thesis (Ph.D.)--Massachusetts Institute of Technology, Dept. of Materials Science and Engineering, 2002.

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High mobility strained Si/SiGe heterostructure MOSFETs : channel engineering and virtual substrate optimization
Id. 1486962
Idioma eng
Titulo High mobility strained Si/SiGe heterostructure MOSFETs : channel engineering and virtual substrate optimization
Autor(es) Leitz, Christopher W. (Christopher William), 1976-
Location http://hdl.handle.net/1721.1/8440
50658402
Versión 1.0
Estado Final
Descripción Thesis (Ph.D.)--Massachusetts Institute of Technology, Dept. of Materials Science and Engineering, 2002.
Tipo 174 leaves
12400141 bytes
12399898 bytes
application/pdf
application/pdf
Palabras clave Materials Science and Engineering.
Tipo de recurso Thesis
Tipo de Interactividad Expositivo
Nivel de Interactividad muy bajo
Audiencia Estudiante
Profesor
Autor
Estructura Atomic
Coste no
Copyright
M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.
Formatos 174 leaves
12400141 bytes
12399898 bytes
application/pdf
application/pdf
Requerimientos técnicos Browser: Any
Fecha de contribución 07-may-2008
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