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Efficient Pattern Mapping for Deterministic Logic BIST

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Efficient Pattern Mapping for Deterministic Logic BIST
Id. 45858446
Idioma inglés
Titulo Efficient Pattern Mapping for Deterministic Logic BIST
Autor(es) Hans-joachim Wunderlich
Localización http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.118.6794
Versión 1.0
Estado Final
Descripción Deterministic logic BIST (DLBIST) is an attractive test strategy, since it combines advantages of deterministic external testing and pseudo-random LBIST. Unfortunately, previously published DLBIST methods are unsuited for large ICs, since computing time and memory consumption of the DLBIST synthesis algorithms increase exponentially, or at least cubically, with the circuit size. In this paper, we propose a novel DLBIST synthesis procedure that has nearly linear complexity in terms of both computing time and memory consumption. The new algorithms are based on binary decision diagrams (BDDs). We demonstrate the efficiency of the new algorithms for industrial designs up to 2M gates.
Tipo application/pdf
Palabras clave Logic BIST
Tipo de recurso Texto Narrativo
Tipo de Interactividad Expositivo
Nivel de Interactividad muy bajo
Audiencia Estudiante
Profesor
Autor
Estructura Atomic
Coste no
Copyright
Metadata may be used without restrictions as long as the oai identifier remains attached to it.
Formatos application/pdf
Requerimientos técnicos Browser: Any
Relación [IsBasedOn] http://www.itcprogramdev.org/itc2004proc/papers/pdfs/0003_1.pdf
[References] 10.1.1.1.5124
[References] 10.1.1.46.1280
[References] 10.1.1.26.8153
[References] 10.1.1.17.6514
[References] 10.1.1.105.1340
[References] 10.1.1.52.830
[References] 10.1.1.37.8360
[References] 10.1.1.66.239
[References] 10.1.1.73.467
[References] 10.1.1.119.7783
Fecha de contribución 15-jul-2009
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