Logic BIST technology evaluation: an industrial case study
|
Descargar SCORM
¡Sea el primero en solicitar este recurso!
Para poder solicitar este recurso debe identificarse como usuario de la biblioteca
|
| |
Ver
Detalles del recurso
|
|
|
Logic BIST technology evaluation: an industrial case study
|
| Id. |
47389103 |
| Idioma |
inglés
|
| Titulo |
Logic BIST technology evaluation: an industrial case study |
| Autor(es) |
Chris Feige
M. J. Geuzebroek
|
| Localización |
http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.8.8616
|
| Versión |
1.0 |
| Estado |
Final
|
| Descripción |
This paper presents an industrial case study on Built-In Self-Test for random logic (LBIST). The Self-testing Using MISR and Parallel SRSG (STUMPS) approach combined with multi-phase test point insertion (MTPI) has been evaluated on twenty-two industrial proven cores. The whole LBIST flow, including making cores LBIST ready and insertion of test points, has been investigated. The consequences with respect to fault coverage, MTPI parameter selection and area overhead are discussed. The case study results show that LBIST combined with MTPI can achieve comparable stuck-at fault coverages as Automatic Test Pattern Generation (ATPG) by acceptable area overhead.
|
| Tipo |
application/pdf
|
| Palabras clave |
logic BIST
|
| Tipo de recurso |
Texto Narrativo
|
| Tipo de Interactividad |
Expositivo
|
| Nivel de Interactividad |
muy bajo
|
| Audiencia |
Estudiante
Profesor
Autor
|
| Estructura |
Atomic |
| Coste |
no
|
| Copyright |
sí
|
|
Metadata may be used without restrictions as long as the oai identifier remains attached to it. |
| Formatos |
application/pdf
|
| Requerimientos técnicos |
Browser: Any
|
| Relación |
[IsBasedOn] http://ce.et.tudelft.nl/~mjgeuze/papers/lbist_eval01.pdf
[References] 10.1.1.99.9311
|
| Fecha de contribución |
02-sep-2009 |
| Contacto |
|
|
|
|
|
Valoración de los usuarios
No hay ninguna valoración para este recurso. Sea el primero en
valorar este recurso.
|
|
|
|
