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Persistent currents in Möbius strips
Yakubo, Kousuke
Avishai, Yshai
Cohen, Doron
???, ??
Location: http://hdl.handle.net/2115/5649
PHYSICAL REVIEW B. 67, 2003, 125319-
http://dx.doi.org/10.1103/PhysRevB.67.125319

The relation between the geometry of a two-dimensional sample and its equilibrium physical properties is exemplified here for a system of noninteracting electrons on a Mo¨bius strip. Dispersion relation for a clean sample is derived and its persistent current under moderate disorder is elucidated, using statistical analysis pertinent to a single sample experiment. The flux periodicity is found to be distinct from that in a cylindrical sample, and the essential role of disorder in the ability to experimentally identify a Mo¨bius strip is pointed out.

Belongs to: Hokkaido University Collection of Scholarly and Academic Papers

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Persistent currents in Möbius strips
Id. 5709659
Idioma inglés
Titulo Persistent currents in Möbius strips
Autor(es) Yakubo, Kousuke
Avishai, Yshai
Cohen, Doron
???, ??
Location http://hdl.handle.net/2115/5649
PHYSICAL REVIEW B. 67, 2003, 125319-
http://dx.doi.org/10.1103/PhysRevB.67.125319
Versión 1.0
Estado Final
Descripción The relation between the geometry of a two-dimensional sample and its equilibrium physical properties is exemplified here for a system of noninteracting electrons on a Mo¨bius strip. Dispersion relation for a clean sample is derived and its persistent current under moderate disorder is elucidated, using statistical analysis pertinent to a single sample experiment. The flux periodicity is found to be distinct from that in a cylindrical sample, and the essential role of disorder in the ability to experimentally identify a Mo¨bius strip is pointed out.
Tipo 84375 bytes
application/pdf
Palabras clave 342
Tipo de recurso article
Tipo de Interactividad Expositivo
Nivel de Interactividad muy bajo
Audiencia Estudiante
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Estructura Atomic
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Copyright
Copyright © 2003 American Physical Society
Formatos 84375 bytes
application/pdf
Requerimientos técnicos Browser: Any
Relación [References] http://www.aps.org/
Fecha de contribución 25-oct-2007
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